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Dielectric and Theoretical Studies on L-histidinium 2-nitrobenzoate NLO Single Crystal

by Sagadevan Suresh
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International Journal of Applied Information Systems
Foundation of Computer Science (FCS), NY, USA
Volume 4 - Number 6
Year of Publication: 2012
Authors: Sagadevan Suresh
10.5120/ijais12-450773

Sagadevan Suresh . Dielectric and Theoretical Studies on L-histidinium 2-nitrobenzoate NLO Single Crystal. International Journal of Applied Information Systems. 4, 6 ( December 2012), 11-14. DOI=10.5120/ijais12-450773

@article{ 10.5120/ijais12-450773,
author = { Sagadevan Suresh },
title = { Dielectric and Theoretical Studies on L-histidinium 2-nitrobenzoate NLO Single Crystal },
journal = { International Journal of Applied Information Systems },
issue_date = { December 2012 },
volume = { 4 },
number = { 6 },
month = { December },
year = { 2012 },
issn = { 2249-0868 },
pages = { 11-14 },
numpages = {9},
url = { https://www.ijais.org/archives/volume4/number6/362-0773/ },
doi = { 10.5120/ijais12-450773 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2023-07-05T10:47:30.099961+05:30
%A Sagadevan Suresh
%T Dielectric and Theoretical Studies on L-histidinium 2-nitrobenzoate NLO Single Crystal
%J International Journal of Applied Information Systems
%@ 2249-0868
%V 4
%N 6
%P 11-14
%D 2012
%I Foundation of Computer Science (FCS), NY, USA
Abstract

A nonlinear optical single crystal of L-histidinium 2-nitrobenzoate has been grown by slow evaporation method. The grown crystal was subjected to single crystal X-ray diffraction analysis to confirm that the crystal belongs to the monoclinic system. Dielectric studies reveal that both dielectric constant and dielectric loss decreases with increase in frequency at different temperatures. Some fundamental data such as valance electron plasma energy, Penn gap, Fermi energy and electronic polarizability of the grown crystal were calculated.

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Index Terms

Computer Science
Information Sciences

Keywords

Crystal growth Slow evaporation method Single crystal XRD Dielectric studies

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