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Reseach Article

Adaptive Post-silicon Server Validation using Machine Learning

by Paidipeddi Pridhiviraj, Tomar Dheerendra S, P Muralidhar
International Journal of Applied Information Systems
Foundation of Computer Science (FCS), NY, USA
Volume 9 - Number 1
Year of Publication: 2015
Authors: Paidipeddi Pridhiviraj, Tomar Dheerendra S, P Muralidhar
10.5120/ijais15-451358

Paidipeddi Pridhiviraj, Tomar Dheerendra S, P Muralidhar . Adaptive Post-silicon Server Validation using Machine Learning. International Journal of Applied Information Systems. 9, 1 ( June 2015), 24-32. DOI=10.5120/ijais15-451358

@article{ 10.5120/ijais15-451358,
author = { Paidipeddi Pridhiviraj, Tomar Dheerendra S, P Muralidhar },
title = { Adaptive Post-silicon Server Validation using Machine Learning },
journal = { International Journal of Applied Information Systems },
issue_date = { June 2015 },
volume = { 9 },
number = { 1 },
month = { June },
year = { 2015 },
issn = { 2249-0868 },
pages = { 24-32 },
numpages = {9},
url = { https://www.ijais.org/archives/volume9/number1/750-1358/ },
doi = { 10.5120/ijais15-451358 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2023-07-05T18:59:40.563230+05:30
%A Paidipeddi Pridhiviraj
%A Tomar Dheerendra S
%A P Muralidhar
%T Adaptive Post-silicon Server Validation using Machine Learning
%J International Journal of Applied Information Systems
%@ 2249-0868
%V 9
%N 1
%P 24-32
%D 2015
%I Foundation of Computer Science (FCS), NY, USA
Abstract

This paper mainly focuses on providing solutions for efficient feature validation. Modern day server processors and computer systems are developed with billions of transistors. Validation of such a complex systems is playing a crucial role in current research. Pre-silicon validation is not enough to get a full system functional coverage. Post-silicon validation is a necessary step to validate these complex systems and to determine the escaped functional silicon bugs during pre-silicon validation. During post-silicon validation in order to get a full system functional coverage there are more number of features for testing. Applying all the features manually and going through the each test results is difficult to maintain. In order to reduce resource requirements for determining test failure signature, and to reduce the time to debug the failure, introduced the machine learning in current validation environment. The proposed validation algorithm in this paper, which is very useful in feature validation of server processer's and is adaptive to the previous validation learning's. Validation is mainly carried out for power management features provided by Advanced Configuration and Power Interface specification. The functional coverage implemented for important power management features namely processor power states, processor performance states and thermal states. This feature coverage analysis is provided through graphical plots.

References
  1. Subhasish Mitra , Sanjit A. Seshia, and Nicola Nicolici, Post-Silicon Validation Opportunities, Challenges and Recent Advances. Design Automation Conference (DAC), 2010 47th ACM/IEE
  2. Intel Platform and Component Validation A Commitment to Quality, Reliability and Compatibility. http://www. intel. com/design/chipsets/labtour/pvpt_whitepaper. htm
  3. Amir Nahir, Avi Ziv, Rajesh Galivanche, Alan Hu, Miron Abramovici, Bob Bentley, Valeria Bertacco, Albert Camilleri, Harry Foster, and Shakti Kapoor "Bridging Pre-Silicon Verification and Post-Silicon Validation" DAC'10, June 13-18, 2010, Anaheim, California, USA. ACM 978-1-4503-0002-5/10/06
  4. Adir, S. Copty, S. Landa, A. Nahir, G. Shurek, A. Ziv, C. Meissner, and J. Schumann, ''A unified methodology for pre-silicon verification and post-silicon validation,'' in Proc. Design Autom. Test Eur. Conf. Exhibit. , 2011, DOI: 10. 1109/DATE. 2011. 5763252.
  5. Pridhiviraj Paidipeddi and Dheerendra Singh Tomar "Machine Learning Adaptation in Post Silicon Server Validation" International Journal of Applied Information Systems (IJAIS) – ISSN: 2249-0868 Foundation of Computer Science FCS, New York, USA, Volume 7– No. 11, November 2014 – www. ijais. org
  6. Intel® Performance Counter Monitor - A better way to measure CPU utilization. https://software. intel. com/en-us/articles/intel-performance-counter-monitor
  7. White Paper: Power Management in Intel® Architecture Servers, April 2009
  8. Advanced configuration and power interface specification, Revision 5. 0a, November 13, 2013
  9. http://acpi. info/spec. htm
  10. Jonathan A. Winter , David H. Albonesi , Christine A. Shoemaker, Scalable thread scheduling and global power management for heterogeneous many-core architectures, Proceedings of the 19th international conference on Parallel architectures and compilation techniques, September 11-15, 2010, Vienna, Austria [doi>10. 1145/1854273. 1854283]"
  11. Intel® Turbo Boost Technology in Intel® Core™ Microarchitecture (Nehalem) Based Processors, white paper
  12. Stuart Hayes | Enterprise Linux Engineering, Controlling Processor C-State Usage in Linux. A Dell technical white paper describing the use of C-states with Linux operating systems
  13. White paper: Enhanced Intel® SpeedStep® Technology for the Intel® Pentium® M Processor, March 2004, Order Number: 301170-001
  14. Understanding Power Management of Intel® Processors for Mil/Aero Applications, cutriss wright controls, Embedded computing
  15. E. Rotem, A. Naveh, et al. , "Analysis of Thermal Monitor features of the Intel Pentium M Processor", Proceedings of TACS-01, ISCA-31, 2004.
  16. A. Naveh, E. Rotem, et al. ,"Power and Thermal Management in the Intel® Core™ Duo" , Intel Technology Journal Vol. 10 #2, 2006. ITJ MY
  17. Intel® 64 and IA-32 Architectures Software Developer's Manual, http://www. intel. com/content/www/us/en/architecture-and-technology/64-ia-32-architectures-software-developer-instruction-set-reference-manual-325383. html
  18. Phil Simon (March 18, 2013). Too Big to Ignore: The Business Case for Big Data. Wiley. p. 89. ISBN 978-1118638170.
  19. Mitchell, T. (1997). Machine Learning, McGraw Hill. ISBN 0-07-042807-7, p. 2.
  20. Andrew DeOrio, Qingkun Li, Matthew Burgess and Valeria Bertacco, Machine Learning-based Anomaly Detection for Post-silicon Bug Diagnosis, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013, pp. 491.
  21. Wernick, Yang, Brankov, Yourganov and Strother, Machine Learning in Medical Imaging, IEEE Signal Processing Magazine, vol. 27, no. 4, July 2010, pp. 25-38.
  22. Intel® Xeon® Processor D-1500 Product Family Datasheet- Volume 1 of 4: Integrated Platform Controller Hub
Index Terms

Computer Science
Information Sciences

Keywords

Adaptation Debugging Feature Functional coverage Learning set Machine learning Pre-silicon Post-silicon Power management System under test (SUT) Thermal management and Validation.